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Hioki 3504-60 C Hi-Tester (120Hz & 1kHz) with GP-IB, Binning, Contact
C Hi-Tester (120Hz & 1kHz) w/GP-IB, Binning, Contact
Order #: 3504-60
Mfg #: 3504-60
Hioki 3504-60 C Hi-Tester (120Hz & 1kHz) with GP-IB, Binning, Contact
C Hi-Tester (120Hz & 1kHz) w/GP-IB, Binning, Contact
Order #: 3504-60
Mfg #: 3504-60
Availability:
This item is no longer available. Please contact Transcat Customer Service
for assistance with alternative product suggestions to meet your exact needs.
Product Highlights
- High speed measurement of 2ms
- Supports C measurements with voltage dependency characteristics through the use of constant voltage testing (CV)
- Model 3504-60 can detect contact failure on all 4 terminals for increased reliability
- BIN function on the 3504-60/-50 is ideal for sorting machines
- Model 3504-40 offers high speed and affordability, perfect for integrating into taping machines
- In all models, contact error is constantly monitored during measurement, contributing to increased yield
